IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
standard by IEEE , 01/27/2017
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About This Item
Full Description
Scope
This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).
Purpose
This standard is to be used as the standard definition of DATPG output formats and informational content.
Abstract
Revision Standard - Active.
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
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