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DANSK DS/EN 60749-5 [ Withdrawn ]

Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

standard by Dansk Standard , 07/10/2017

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W/D S/S BY DS/EN IEC 60749-5

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a)   correction of an error in an equation; b)   inclusion of notes for guidance; c)   clarification of the applicability of test conditions.

 

Product Details

Edition:
17#
Published:
07/10/2017
Number of Pages:
15
File Size:
1 file , 1.5 MB
Product Code(s):
DS-013, DS-013
 

Document History

  1. DANSK DSF/FPREN 60749-5


    Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  2. DANSK DS/EN 60749-5

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    Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

    • Most Recent

  3. DANSK DS/EN 60749-5


    Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

    • Historical Version