2650180

DANSK DS/EN IEC 60749-13 [ Active ]

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

standard by Dansk Standard , 04/16/2018

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Full Description

<span lang="EN-US">IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. </span>The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

 

Product Details

Edition:
18
Published:
04/16/2018
Number of Pages:
18
File Size:
1 file , 2.9 MB
Product Code(s):
DS-017, DS-017