31.020: Electronic components in general
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IEEE 1573-2021
IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance
standard by IEEE, 05/09/2022.
Languages: English
Historical Editions: IEEE 1573-2003
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IEEE 1641.1-2006
This document has been replaced. View the most recent version.
IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
standard by IEEE, 04/30/2007.
Languages: English
Historical Editions: IEEE 1641.1-2013
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IEEE 1641.1-2013
IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
standard by IEEE, 06/07/2013.
Languages: English
Amendments, rulings, and supplements: IEEE 1641.1a-2018
Historical Editions: IEEE 1641.1-2006
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IEEE 1641.1a-2018
IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language
Amendment by IEEE, 08/15/2018.
Languages: English
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IEEE 1641-2004
This document has been replaced. View the most recent version.
IEEE Standard for Signal and Test Definition
standard by IEEE, 03/25/2005.
Languages: English
Historical Editions: IEEE 1641-2022, IEEE 1641-2010
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IEEE 1641-2010
This document has been replaced. View the most recent version.
IEEE Standard for Signal and Test Definition
standard by IEEE, 09/17/2010.
Languages: English
Historical Editions: IEEE 1641-2022, IEEE 1641-2004
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IEEE 1641-2022
IEEE Standard for Signal and Test Definition
standard by IEEE, 02/10/2023.
Languages: English
Historical Editions: IEEE 1641-2010, IEEE 1641-2004
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IEEE 200-1975 [ Withdrawn ]
IEEE Standard Reference Designations for Electrical and Electronics Parts and Equipments
standard by IEEE, 12/30/1975.
Languages: English
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IEEE 267-1966
IEEE Trial-Use Recommended Practice for the Preparation and Use of Symbols
standard by IEEE, 12/31/1966.
Languages: English
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IEEE 274-1966 [ Withdrawn ]
Standard Definitions of Terms for Integrated Electronics
standard by IEEE, 11/30/1965.
Languages: English
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