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SAME AS IEC 60444-4

This report specifies a simple method of measuring load resonance frequency fL and load resonance resistance RL in the frequency range up to 30 MHz. These measurements allow calculation of load resonance frequency offset fL, frequency pulling range fL1,L2 and pulling sensitivity S as described in Amendment No. 1 to IEC Publication 122-1. The method uses the change in resonance frequency from fr to fL (i.e. fL) which occurs when a load capacitance CL is inserted in series with the crystal unit.