-
-
Available Formats
- Options
- Availability
- Priced From ( in USD )
-
Available Formats
-
- Immediate download
- $48.00
- Add to Cart
-
- Printed Edition
- Ships in 1-2 business days
- $48.00
- Add to Cart
-
- Printed Edition + PDF
- Immediate download
- $62.00
- Add to Cart
Customers Who Bought This Also Bought
-
QPL QML-19500-31
Priced From $69.00 -
MIL MIL-PRF-19500/392K
Priced From $24.00 -
MIL MIL-PRF-19500/578R
Priced From $24.00 -
MIL MIL-PRF-19500/118N
Priced From $24.00
About This Item
Full Description
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Document History
-
MIL MIL-STD-750-1A Change 2
viewing
Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999- Most Recent
-
MIL MIL-STD-750-1A
Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999- Historical Version
-
MIL MIL-STD-750-1 w/Change 2
ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999- Historical Version
-
MIL MIL-STD-750-1
ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999- Historical Version