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About This Item
Full Description
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
Document History
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IEC 60749-5 Ed. 3.0 b:2023
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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test- Most Recent
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IEC 60749-5 Ed. 2.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test- Historical Version
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IEC 60749-5 Ed. 2.0 en:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test- Historical Version
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IEC 60749-5 Ed. 1.0 b:2003
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test- Historical Version