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About This Item
Full Description
This part of ISO 11254 specifies a test method for determining the single-shot laser radiation-induced damage threshold (LIDT) of optical surfaces.
This test procedure is applicable to all combinations of different laser wavelengths and pulse lengths. However comparison of laser damage threshold data may be misleading unless the measurements have been carried out at identical wavelengths, pulse lengths and beam diameters.
Application of this part of ISO 11254 is provisionally restricted to irreversible damage of optical surfaces.
The extrapolation of damage data can lead to inaccurate or wrong calculated results and to an overestimation of the LIDT. In the case of toxic materials (e.g. ZnSe, GaAs, CdTe, ThF4, chalcogenides, Be, Cr, Ni) this could lead to severe health hazards.
Document History
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ISO 21254-1:2011
Lasers and laser-related equipment - Test methods for laser-induced damage threshold - Part 1: Definitions and general principles- Most Recent
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ISO 11254-2:2001
Lasers and laser-related equipment - Determination of laser-induced damage threshold of optical surfaces - Part 2: S-on-1 test- Historical Version
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ISO 11254-1:2000
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Lasers and laser-related equipment -- Determination of laser-induced damage threshold of optical surfaces -- Part 1: 1-on-1 test- Historical Version