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About This Item
Full Description
1.1 This method covers the size distribution analysis of particulate contamination, 5 m or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (33 % of the average of two runs) should be expected for replicate counts on the same sample.
Note 1--For satisfactory results on clean parts, it is recommended that all procedures involved in sample preparation be conducted under a dust shield.
Document History
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ASTM F24-20
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces- Most Recent
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ASTM F24-09(2015)
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces- Historical Version
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ASTM F24-09
Standard Method for Measuring and Counting Particulate Contamination on Surfaces- Historical Version
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ASTM F24-04
Standard Method for Measuring and Counting Particulate Contamination on Surfaces- Historical Version
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ASTM F24-00
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Standard Method for Measuring and Counting Particulate Contamination on Surfaces- Historical Version