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About This Item
Full Description
This edition includes the following significant technical changes with respect to the previous edition:
- extension of the scope of the test standard from electronic to electromechanic components and press-fit pins, which are used for assembly and interconnect technology;
- significant reduction of the testing effort by a knowledge-based selection of test conditions i.e. tests not relevant for a given materials system can be omitted (see Annex D);
- harmonization with JESD 201A by omission of severities M, N for temperature cycling tests;
- highly reduced test duration (1 000 h instead of 4 000 h) for damp-heat test by introducing test condition at elevated humidity of 85 % R.H. and a temperature of 85 °C providing increased severity.
Document History
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IEC 60068-2-82 Ed. 2.0 b:2019
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Environmental testing - Part 2-82: Tests - Test Xw1: Whisker test methods for components and parts used in electronic assemblies- Most Recent
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IEC 60068-2-82 Ed. 2.0 b:2019 Draft
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components- Historical Version
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IEC 60068-2-82 Ed. 1.0 b:2007
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components- Historical Version
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IEC 60068-2-82 Ed. 1.0 en:2007
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components- Historical Version