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About This Item
Full Description
- adoption and modification of STACK Specification S/0001 revision 14 notice 3, update of IEC semiconductor test methods;
- update of JEDEC semiconductor test methods;
- including addition of JEP148A, based on the Physics of Failure Risk and Opportunity assessment;
- update of Annex A with additional JEDEC and IEC test information;
- revision of lead-free termination finish requirements.
Document History
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IEC/TS 62686-1 Ed. 3.0 en:2020
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Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors- Most Recent
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IEC/TS 62686-1 Ed. 2.0 en:2015
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors- Historical Version
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IEC/TS 62686-1 Ed. 1.0 en:2012
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors- Historical Version