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About This Item

 

Full Description

BS EN 62132-1:2016 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).


Cross References:
IEC 62132-2
IEC 62132-3
IEC 62132-4
IEC 62132-5
IEC 62132-8
IEC TS 62132-9
EN 62132-2
EN 62132-3
EN 62132-4
EN 62132-5
EN 62132-8
IEC 60050
IEC 61000-4-3
IEC 61000-4-6
IEC 61967-1:2002
CISPR 20
ANSI/IEEE Std 100-1984
EN 61400-4-3
EN 61400-4-6
EN 61967-1:2002
EN 55020


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS EN 62132-1:2016

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    Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions

    • Most Recent
  2. BS EN 62132-1:2006


    Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-General conditions and definitions

    • Historical Version