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About This Item
Full Description
ISO/TS 10867:2019 gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.
Document History
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ISO/TS 10867:2019
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Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy- Most Recent
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ISO/TS 10867:2010
Nanotechnologies - Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy- Historical Version