Test Instrumentation and Techniques
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HISTORICAL
IEEE 1413-1998
This document has been replaced. View the most recent version.
(Superseded) IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment
standard by IEEE, 01/15/1999.
Languages: English
Historical Editions: IEEE 1413-2010
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MOST RECENT
IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
standard by IEEE, 01/27/2017.
Languages: English
Historical Editions: IEEE 1445-1998
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MOST RECENT
IEEE 1450.1-2005
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
standard by IEEE, 09/30/2005.
Languages: English
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MOST RECENT
IEEE 1450.6-2005
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
standard by IEEE, 04/05/2006.
Languages: English
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MOST RECENT
IEEE 1460-1996
IEEE Guide for the Measurement of Quasi-Static Magnetic and Electric Fields
standard by IEEE, 11/30/1996.
Languages: English
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HISTORICAL
IEEE 1500-2005
This document has been replaced. View the most recent version.
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
standard by IEEE, 08/29/2005.
Languages: English
Historical Editions: IEEE 1500-2022
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MOST RECENT
IEEE 1505.1-2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
standard by IEEE, 08/20/2019.
Languages: English
Historical Editions: IEEE 1505.1-2008
- Redlines
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HISTORICAL
IEEE 1588-2008
This document has been replaced. View the most recent version.
IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
standard by IEEE, 07/24/2008.
Languages: English
Historical Editions: IEEE 1588-2019, IEEE 1588-2002
- Redlines
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HISTORICAL
IEEE 1636-2009
This document has been replaced. View the most recent version.
IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)
standard by IEEE, 08/14/2009.
Languages: English
Historical Editions: IEEE 1636-2018
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HISTORICAL
IEEE 1641.1-2006
This document has been replaced. View the most recent version.
IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
standard by IEEE, 04/30/2007.
Languages: English
Historical Editions: IEEE 1641.1-2013
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