31.020: Electronic Components In General -

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  1. HISTORICAL

    1861785

    ASTM E1854-13

    This document has been replaced. View the most recent version.

    Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

    standard by ASTM International, 06/01/2013.

    Languages: English

    Historical Editions: ASTM E1854-19ASTM E1854-07ASTM E1854-05ASTM E1854-03ASTM E1854-96

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  2. MOST RECENT

    2012165

    ASTM F1467-18

    Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

    standard by ASTM International, 03/01/2018.

    Languages: English

    Historical Editions: ASTM F1467-11ASTM F1467-99(2005)e1ASTM F1467-99(2005)ASTM F1467-99

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  3. MOST RECENT

    1899183

    ASTM F3147-15 [ Withdrawn ]

    Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend (Withdrawn 2024)

    standard by ASTM International, 06/01/2015.

    Languages: English