TC 201/SC 9: Scanning probe microscopy
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MOST RECENT
ISO 11039:2012
Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
standard by International Organization for Standardization, 02/01/2012.
Languages: English
- MULTI-USER
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MOST RECENT
ISO 11775:2015
Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
standard by International Organization for Standardization, 10/01/2015.
Languages: English
- MULTI-USER
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HISTORICAL
ISO 11952:2014
This document has been replaced. View the most recent version.
Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
standard by International Organization for Standardization, 05/15/2014.
Languages: English
Historical Editions: ISO 11952:2019
- MULTI-USER
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MOST RECENT
ISO 11952:2019
Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
standard by International Organization for Standardization, 06/01/2019.
Languages: English
Historical Editions: ISO 11952:2014
- MULTI-USER
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MOST RECENT
ISO 13083:2015
Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
standard by International Organization for Standardization, 08/15/2015.
Languages: English
- MULTI-USER
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MOST RECENT
ISO 13095:2014
Surface Chemical Analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
standard by International Organization for Standardization, 07/15/2014.
Languages: English
- MULTI-USER
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MOST RECENT
ISO 21222:2020
Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
standard by International Organization for Standardization, 02/01/2020.
Languages: English
- MULTI-USER
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MOST RECENT
ISO 23729:2022
Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
standard by International Organization for Standardization, 07/01/2022.
Languages: English
- MULTI-USER
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MOST RECENT
ISO 27911:2011
Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
standard by International Organization for Standardization, 08/01/2011.
Languages: English
- MULTI-USER
