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IEC 60749-26 Ed. 2.0 b:2006 [ Withdrawn ]

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

standard by International Electrotechnical Commission , 07/18/2006

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Full Description

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.
 

Product Details

Edition:
2.0
Published:
07/18/2006
Number of Pages:
27
File Size:
1 file , 520 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. IEC 60749-26 Ed. 4.0 b:2018


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Most Recent

  2. IEC 60749-26 Ed. 3.0 b:2013


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version

  3. IEC 60749-26 Ed. 2.0 b:2006

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    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version

  4. IEC 60749-26 Ed. 1.0 b:2003


    Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

    • Historical Version