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IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ]

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

standard by International Electrotechnical Commission , 04/12/2002

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Full Description

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
 

Product Details

Edition:
1.0
Published:
04/12/2002
Number of Pages:
7
File Size:
1 file , 380 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. IEC 60749-6 Ed. 2.0 b:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

    • Most Recent

  2. IEC 60749-6 Ed. 2.0 en:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

    • Historical Version

  3. IEC 60749-6 Ed. 1.0 b CORR1:2003


    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

    • Historical Version

  4. IEC 60749-6 Ed. 1.0 b:2002

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    Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. IEC 60749-6 Ed. 1.0 b CORR1:2003

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    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature