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About This Item
Full Description
This edition includes the following significant technical changes with respect to the previous edition:
a) additional test conditions;
b) clarification of the applicability of test conditions.
Document History
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IEC 60749-6 Ed. 2.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature- Most Recent
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IEC 60749-6 Ed. 2.0 en:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature- Historical Version
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IEC 60749-6 Ed. 1.0 b CORR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature- Historical Version
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IEC 60749-6 Ed. 1.0 b:2002
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature- Historical Version