31.200: Integrated Circuits. Microelectronics -

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  1. MOST RECENT

    1916879

    ASTM F744M-16 [ Withdrawn ]

    Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)

    standard by ASTM International, 05/01/2016.

    Languages: English

    Historical Editions: ASTM F744M-10ASTM F744M-97(2003)ASTM F744M-97

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  2. MOST RECENT

    1917452

    ASTM F773M-16 [ Withdrawn ]

    Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)

    standard by ASTM International, 05/01/2016.

    Languages: English

    Historical Editions: ASTM F773M-10ASTM F773M-96(2003)ASTM F773M-96

    • Redlines