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About This Item
Full Description
ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)
Document History
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ISO 29301:2023
Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures- Most Recent
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ISO 29301:2017
Microbeam analysis - Analytical electron microscopy - Methods for calibrating image magnification by using reference materials with periodic structures- Historical Version
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ISO 29301:2010
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Microbeam analysis - Analytical transmission electron microscopy - Methods for calibrating image magnification by using reference materials having periodic structures- Historical Version