35.240.30: IT applications in information, documentation and publishing
Search Results
-
MOST RECENT
IEEE 1599-2008
IEEE Recommended Practice for Defining a Commonly Acceptable Musical Application Using XML
standard by IEEE, 09/26/2008.
Languages: English
- MULTI-USER
-
HISTORICAL
IEEE 1671.1-2009
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
standard by IEEE, 12/11/2009.
Languages: English
Historical Editions: IEEE 1671.1-2017
- MULTI-USER
-
MOST RECENT
IEEE 1671.1-2017
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
standard by IEEE, 03/19/2018.
Languages: English
Corrigenda: IEEE 1671.1-2017/Cor 1-2023
Historical Editions: IEEE 1671.1-2009
- MULTI-USER
-
MOST RECENT
IEEE 1671.1-2017/Cor 1-2023
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
Corrigenda by IEEE, 04/26/2024.
Languages: English
- MULTI-USER
-
HISTORICAL
IEEE 1671-2006
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by IEEE, 12/15/2006.
Languages: English
Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2010
- MULTI-USER
-
HISTORICAL
IEEE 1671-2010
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by IEEE, 01/20/2011.
Languages: English
Historical Editions: IEEE/IEC 61671-2012, IEEE 1671-2006
- MULTI-USER
-
HISTORICAL
IEEE 1671.2-2008
This document has been replaced. View the most recent version.
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
standard by IEEE, 12/17/2008.
Languages: English
Historical Editions: IEEE 1671.2-2012
- MULTI-USER
-
MOST RECENT
IEEE 1671.2-2012
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
standard by IEEE, 02/15/2013.
Languages: English
Historical Editions: IEEE 1671.2-2008
- Redlines
- MULTI-USER
-
HISTORICAL
IEEE 1671.3-2007
This document has been replaced. View the most recent version.
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
standard by IEEE, 03/28/2008.
Languages: English
Historical Editions: IEEE 1671.3-2017
- MULTI-USER
-
MOST RECENT
IEEE 1671.3-2017
IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
standard by IEEE, 04/13/2018.
Languages: English
Historical Editions: IEEE 1671.3-2007
- MULTI-USER
