BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
standard by BSI Group , 10/30/1987
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About This Item
Full Description
Cross References:
BS 2011
BS 2045
BS 3363
BS 3934
BS 3939
BS 4727
BS 4760
BS 5555
BS 5775
BS 6001
BS 9000:Part 2
BS 9300
BS E9007
IEC 134
BS 9000:Part 1
IEC 68-1
IEC 68-2-2
IEC 68-2-2A
IEC 68-2-3
IEC 68-2-6
IEC 68-2-7
IEC 68-2-14
IEC 68-2-17
IEC 68-2-20
IEC 68-2-21
IEC 68-2-27
IEC 68-2-38
IEC 68-2-45
CECC 00102
CECC 00103
CECC 00106
CECC 00107
CECC 00108
CECC 00109
CECC 00110
CECC 00111
CECC 00112
CECC 00113
Replaces BS 9300:1969 which remains current due to existing approvals.
Document History
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BS CECC 50000:1987
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Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices- Most Recent
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BS CECC 50000:SUPPLEMENT NO. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average- Historical Version
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BS CECC 50000:1981
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices- Historical Version
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BS 9300:1969
Specification for semiconductor devices of assessed quality: generic data and methods of test- Historical Version
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