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About This Item
Full Description
Cross References:
IEC 61340-3-2
IEC 60749-26
EN 61340-3-2:2002
EN 60749-26:2006
Partially replaces BS EN 60749:1999.
Incorporates the following:
Amendment, January 2013. Amends and replaces BS EN 60749-27:2006
Document History
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BS EN 60749-27:2006+A1:2012
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Semiconductor devices. Mechanical and climatic test methods-Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)- Most Recent
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BS EN 60749-27:2006
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)- Historical Version
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BS EN 60749:1999
Semiconductor devices. Mechanical and climatic test methods- Historical Version
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BS 6493-3:1985
Semiconductor devices-Mechanical and climatic test methods- Historical Version