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About This Item
Full Description
Cross References:
EN 61000-4-6:1996
CISPR 16-1-5
AMD 1:2005
CISPR 16-1-4
CISPR 16-1-2
CISPR 16-1-3
EN 55016-1-1
EN 55016-1-4:2004
EN 55016-1-2:2004
CISPR 16-1-1
IEC 61000-4-6
IEC 61967-1
EN 55016-1-5:2004
EN 55016-1-3:2006
EN 61967-1:2002
Incorporates the following:
Corrigendum, April 2018; Corrigendum, January 2008
Document History
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BS EN IEC 61967-4:2021
Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method- Most Recent
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BS EN 61967-4:2002+A1:2006
viewing
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method- Historical Version
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BS EN 61967-4:2002
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method- Historical Version