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Full Description

BS EN 61967-4:2002+A1:2006 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 resistive probe and RF voltage measurement using a 150 coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.


Cross References:
EN 61000-4-6:1996
CISPR 16-1-5
AMD 1:2005
CISPR 16-1-4
CISPR 16-1-2
CISPR 16-1-3
EN 55016-1-1
EN 55016-1-4:2004
EN 55016-1-2:2004
CISPR 16-1-1
IEC 61000-4-6
IEC 61967-1
EN 55016-1-5:2004
EN 55016-1-3:2006
EN 61967-1:2002


Incorporates the following:
Corrigendum, April 2018; Corrigendum, January 2008
 

Document History

  1. BS EN IEC 61967-4:2021


    Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method

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  2. BS EN 61967-4:2002+A1:2006

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    Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method

    • Historical Version
  3. BS EN 61967-4:2002


    Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method

    • Historical Version