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About This Item
Full Description
Cross References:
BS 2011:Part 1.1
BS 2011:Part 2.1
BS 3934:Part 1
BS 3934:Part 2
BS 3934:Part 3
BS 3939
BS 5555
BS 6001:Part 1
BS 6100:Section 3. 1
BS 6493:Section 1.1
BS 6493:Section 1.2
BS 6493:Section 1.3
BS 6493:Section 1.5
BS 6493:Section 2.1
BS 6493:Section 2.2
BS 6493:Section 2.3
BS 6493:Part 3
BS 7151
BS 9000:Part 3
BS QC 790100
Replaces BS 9450:1998 which remains current and BS 9970:Part 0:1985 which is withdrawn.
Incorporates the following:
AMD 9348 published 15 February 1997
Corrigendum, July 2011
Document History
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BS IEC 60747-10:1991
viewing
Semiconductor devices-Generic specification for discrete devices and integrated circuits- Most Recent
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BS 9450:1998
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test- Historical Version
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BS 9970-0:1985
Harmonized system of quality assessment for electronic components. Semiconductor devices-Generic specification- Historical Version
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BS 9450:1975
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test- Historical Version