BS PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions. Near-field scan data exchange format
standard by BSI Group , 09/30/2015
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About This Item
Full Description
The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.
The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
Cross References:
IEC 60050
IEC 61967-1
ISO 8879
ANSI INCITS 4:1986
IEEE Std 754-2008
IEC TS 61967-3
IEC TS 62132-9
IEC 60050-131
IEC 60050-161
IEC 62132-1
All current amendments available at time of purchase are included with the purchase of this document.
Document History
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BS PD IEC/TR 61967-1-1:2015
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