2069498 Preview

AS 2547.3.1-1986 [ Withdrawn ]

Semiconductor devices, Part 3.1: Mechanical and climatic test methods

standard by Standards Australia , 01/01/1986

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Secure PDF 🔒
    • 👥
    • Immediate download
    • $52.38
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Product Details

Edition:
1st
Published:
01/01/1986
ISBN(s):
0726242519
Number of Pages:
25
File Size:
1 file , 1.2 MB
Product Code(s):
10169229
Note:
This product is unavailable in Russia, Belarus
 

Document History

  1. AS 2547.3.1-1986

    👀 currently
    viewing


    Semiconductor devices, Part 3.1: Mechanical and climatic test methods

    • Most Recent

  2. AS 2547.3-1983


    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Reference methods of measurement

    • Historical Version

  3. AS C366.5-1978


    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 5: Mechanical and climatic test methods

    • Historical Version

  4. AS C366.3-1972


    Essential ratings and characteristics of semiconductor devices and general principles of measuring methods, Part 3: Reference methods of measurement

    • Historical Version