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ASTM E1855-96

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

standard by ASTM International , 12/10/1996

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Full Description

1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.

 

Product Details

Published:
12/10/1996
Number of Pages:
11
File Size:
1 file , 150 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. ASTM E1855-20


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Most Recent

  2. ASTM E1855-15


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  3. ASTM E1855-10


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  4. ASTM E1855-05e1


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  5. ASTM E1855-05


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  6. ASTM E1855-04e1


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  7. ASTM E1855-04


    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version

  8. ASTM E1855-96

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    Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    • Historical Version