1880971

ASTM F1262M-14 [ Withdrawn ]

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

standard by ASTM International , 06/01/2014

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $68.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $92.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.

1.1.1 Discussion-This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

 

Product Details

Published:
06/01/2014
Number of Pages:
6
File Size:
1 file , 89 KB
Redline File Size:
2 files , 170 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. ASTM F1262M-14

    👀 currently
    viewing


    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)

    • Most Recent

  2. ASTM F1262M-95(2008)


    Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    • Historical Version

  3. ASTM F1262M-95(2002)


    Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

    • Historical Version

  4. ASTM F1262M-95


    Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits

    • Historical Version