BS IEC 60747-10:1991

Semiconductor devices-Generic specification for discrete devices and integrated circuits

standard by British Standard / International Electrotechnical Commission , 07/31/2011

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Full Description

General procedures for quality assessment to be used in the IECQ system and general rules for measurement methods of electrical characteristics, climatic and mechanical tests and endurance tests.

Cross References:
BS 2011:Part 1.1
BS 2011:Part 2.1
BS 3934:Part 1
BS 3934:Part 2
BS 3934:Part 3
BS 3939
BS 5555
BS 6001:Part 1
BS 6100:Section 3. 1
BS 6493:Section 1.1
BS 6493:Section 1.2
BS 6493:Section 1.3
BS 6493:Section 1.5
BS 6493:Section 2.1
BS 6493:Section 2.2
BS 6493:Section 2.3
BS 6493:Part 3
BS 7151
BS 9000:Part 3
BS QC 790100

Replaces BS 9450:1998 which remains current and BS 9970:Part 0:1985 which is withdrawn.

Incorporates the following:
AMD 9348 published 15 February 1997
Corrigendum, July 2011

Product Details

Published:: 07/31/2011
ISBN(s):: 9780580748202
Number of Pages:: 38
File Size:: 1 file , 780 KB
Product Code(s):: 30243568, 30243568, 30243568