This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.

This document has the following objectives:
— to increase the comparability of measurements of geometrical quantities made using SPMs by traceability to the unit of length;
— to define the minimum requirements for the calibration process and the conditions of acceptance;
— to ascertain the instrument's ability to be calibrated (assignment of a "calibrate-ability" category to the instrument);
— to define the scope of the calibration (conditions of measurement and environments, ranges of measurement, temporal stability, transferability);
— to provide a model, in accordance with ISO/IEC Guide 98-3, to calculate the uncertainty for simple geometrical quantities in measurements using an SPM;
— to define the requirements for reporting results.

Cross References:
ISO/IEC Guide 98-3
ISO 11039
IEC/TS 62622
ISO 18115-2
ISO 5436-1
ISO 12179
ISO 4288
ISO Guide 34
ISO Guide 30
ISO 12853
ISO 4287
ISO 3274


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