Language:
    • Available Formats
    •  
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $90.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This part of IEC 61967 specifies a method to measure the conducted electromagentic emission (EME) of integrated circuits by direct radion frequency (RF) current measurement with a 1 ohm resitive probe and RF voltage measurement using a 150 ohm coupling network. These methods quarantee a high degree of repeatability and correlation of EME measurements.

 

Document History

  1. DANSK DSF/PREN 61967-4


    Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

    • Historical Version
  2. DANSK DS/EN 61967-4

    👀 currently
    viewing


    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method

    • Most Recent
 

Amendments, rulings, supplements, and errata

  1. DANSK DS/EN 61967-4/AC


    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method

  2. DANSK DS/EN 61967-4/A1


    Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method