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ECIA EIA-364-32C [ Revised ]

TP-32C Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

standard by Electronic Components Industry Association , 05/01/2000

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TP-32C * EIA-364-32C

This test is conducted for the purpose of determining the resistance of a given electrical connector or socket to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application.

NOTE - This procedure includes the provision for testing at cryogenic temperatures. Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.

 

Product Details

Edition:
C
Published:
05/01/2000
ANSI:
ANSI Approved
Number of Pages:
20
File Size:
0 files
 

Document History

  1. ECIA EIA-364-32H


    TP-32H Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

    • Most Recent

  2. ECIA EIA-364-32G


    TP-32G Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

    • Historical Version

  3. ECIA EIA-364-32G


    TP-32G Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

    • Historical Version

  4. ECIA EIA-364-32F


    TP-32F THERMAL SHOCK (TEMPERATURE CYCLING) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS

    • Historical Version

  5. ECIA EIA-364-32E


    TP-32E THERMAL SHOCK (TEMPERATURE CYCLING) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS

    • Historical Version

  6. ECIA EIA/ECA-364-32D


    TP-32D Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

    • Historical Version

  7. ECIA EIA-364-32C

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    TP-32C Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

    • Historical Version