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IEC 60749-2 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

standard by International Electrotechnical Commission , 04/12/2002

📝 Amendments Available

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Full Description

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
 

Product Details

Edition:
1.0
Published:
04/12/2002
Number of Pages:
11
File Size:
1 file , 390 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Amendments, rulings, supplements, and errata

  1. IEC 60749-2 Ed. 1.0 b COR. 1:2003

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    Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure