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IEC 60749-5 Ed. 2.0 en:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

standard by International Electrotechnical Commission , 04/10/2017

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Full Description

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.
 

Product Details

Edition:
2.0
Published:
04/10/2017
Number of Pages:
9
File Size:
1 file , 260 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus, Canada
 

Document History

  1. IEC 60749-5 Ed. 3.0 b:2023


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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  2. IEC 60749-5 Ed. 2.0 b:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  3. IEC 60749-5 Ed. 2.0 en:2017

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    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version

  4. IEC 60749-5 Ed. 1.0 b:2003


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version