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Full Description

IEC 60891:2009 defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the procedures used to determine factors relevant for these corrections. Requirements for I-V measurement of photovoltaic devices are laid down in IEC 60904-1. The main technical changes with regard the previous edition are as follows:
- extends edition 1 translation procedure to irradiance change during I-V measurement;
- adds 2 new translation procedures;
- revises procedure for determination of temperature coefficients to include PV modules;
- defines new procedure for determination of internal series resistance;
- defines new procedure for determination of curve correction factor.
 

Document History

  1. IEC 60891 Ed. 3.0 b:2021


    Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics

    • Most Recent
  2. IEC 60891 Ed. 2.0 b:2009

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    Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics

    • Historical Version
  3. IEC 60891 Ed. 1.0 b:1987


    Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices

    • Historical Version