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IEC/TS 62396-5 Ed. 1.0 en:2008

Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems

standard by International Electrotechnical Commission - Technical Standard , 08/19/2008

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IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
 

Product Details

Edition:
1.0
Published:
08/19/2008
Number of Pages:
18
File Size:
1 file , 960 KB
Note:
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