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Full Description

Scope

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

Abstract

Revision Standard - Superseded. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
 

Document History

  1. IEEE 592-2018


    IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

    • Most Recent
  2. IEEE 592-2007

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    IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

    • Historical Version
  3. IEEE 592-1990


    IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors

    • Historical Version
  4. IEEE 592-1977


    IEEE Standard for Exposed Semiconducting Shields on Premolded High Voltage Cable Joints and Separable Insulated Connectors

    • Historical Version