1578891

ISO 22493:2008

Microbeam analysis - Scanning electron microscopy - Vocabulary

standard by International Organization for Standardization , 10/01/2008

This document has been replaced. View the most recent version.

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $160.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $229.00
    • Add to Cart

Customers Who Bought This Also Bought

Identical Versions Available

 

About This Item

 

Full Description

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

 

Product Details

Published:
10/01/2008
File Size:
1 file , 260 KB
Same As:
BS ISO 22493:2008, BS ISO 22493:2008
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. ISO 22493:2014


    Microbeam analysis - Scanning electron microscopy - Vocabulary

    • Most Recent

  2. ISO 22493:2008

    👀 currently
    viewing


    Microbeam analysis - Scanning electron microscopy - Vocabulary

    • Historical Version