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ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.

ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL.

Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

 

Document History

  1. ISO/TS 11888:2017


    Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

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  2. ISO/TS 11888:2011

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    Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors

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