1775329

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE

standard by JEDEC Solid State Technology Association , 02/01/1967

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $59.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $80.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
 

Product Details

Published:
02/01/1967
Number of Pages:
17
File Size:
1 file , 280 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus