1454147

MIL MIL-PRF-19500/658

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, P-CHANNEL SILICON TYPE 2N7438, AND 2N7439 JANSD AND JANSR

standard by Military Specifications and Standards , 05/28/1998

📝 Amendments Available

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Product Details

Published:
05/28/1998
Number of Pages:
21
File Size:
1 file , 160 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Amendments, rulings, supplements, and errata

  1. MIL MIL-PRF-19500/658 Notice 3 - Validation


    Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, P-Channel Silicon Type 2N7438, and 2N7439 JANSD and JANSR

  2. MIL MIL-PRF-19500/658 Notice 2 - Validation


    Semiconductor Device, Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor, P-Channel Silicon Type 2N7438, and 2N7439 JANSD and JANSR

  3. MIL MIL-PRF-19500/658 Notice 1 - Validation


    SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, P-CHANNEL SILICON TYPE 2N7438, AND 2N7439 JANSD AND JANSR