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MIL MIL-STD-750-2A

Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

standard by Military Specifications and Standards , 01/23/2015

📝 Amendments Available

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About This Item

 

Full Description

Revision A (all previous amendments incorporated)

Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
 

Product Details

Published:
01/23/2015
Number of Pages:
301
File Size:
1 file , 14 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. MIL MIL-STD-750-2A

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    viewing


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

    • Most Recent

  2. MIL MIL-STD-750-2A Draft


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

    • Historical Version

  3. MIL MIL-STD-750-2


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. MIL MIL-STD-750-2A Change 3


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

  2. MIL MIL-STD-750-2A Change 4


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

  3. MIL MIL-STD-750-2A Change 2


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999

  4. MIL MIL-STD-750-2A Change 1


    Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 Through 2999