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Full Description

This document describes a procedure for subjecting a broadband device to surge conditions as specified in IEEE C62.411. Ports shall be tested in compliance with IEEE C62.41 Category B3 Combination Waveform or IEEE C62.41 Category A3 Ring Waveform as specified for the Device Under Test.
 

Document History

  1. SCTE 81 2012

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    Surge Withstand Test Procedure

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  2. SCTE 81 2007


    Surge Withstand Test Procedure

    • Historical Version
  3. SCTE 81 2003


    Surge Withstand Test Procedure, (formerly IPS TP 210)

    • Historical Version