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TIA TIA-455-106 [ Active ]

FOTP 106 Procedures for Determining Threshold Current of Semiconductor Lasers

standard by Telecommunications Industries Association , 11/01/1992

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Full Description

This test covers the wavelength range from 600 nanometers to 1700 nanometers using a spectrophotometer capable of generating visible and near-infrared light. This method covers primary, secondary, and single coatings (e.g., acrylate, polyimide, and silicone), as well as pigmented coatings, that can be prepared in film specimens.

 

Product Details

Edition:
92
Published:
11/01/1992
Number of Pages:
23
File Size:
1 file , 800 KB