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About This Item
Full Description
Cross References:
IEC 60749-27:2006 Ed 2
IEC 60749-26:2013 ED3
IEC 61837-2:2011/AMD1:2014
ISO 80000-1:2009 Ed 1
IEC 62884-1:2017
IEC 61837-1:2012
IEC 60050-561:2014
IEC 61837-2:2011
IEC 61340-5-1:2016
IEC TR 61000-4-1:2016
IEC 60469:2013
IEC 60617
IEC 60748-2
IEC 60027
ATIS-0900105.03.2003(R2008)
MIL-PRF-55310E
ATIS-0900101.2006
ITU-T G.813
ETSI EN 300 462
ITU-T G.825
ITU-T G.810
IEC 60679-4:1997
IEC 60679-2:1981
IEC 61837-3:2015
IEC 60679-5:1998
IEC 61019-1:2004
IEC 60068-2-27:2008
IEC 60679-3:2012
IEC 60068-2-64:2008
IEC 60068-2-6:2007
IEC 60122-1:2002
IEC 61837-4:2015
IEC 61019-2:2005
IEC 60068-2-17:1994
All current amendments available at time of purchase are included with the purchase of this document.
Document History
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BS EN 60679-1:2017
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality-Generic specification- Most Recent
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BS EN 60679-1:2007
Quartz crystal controlled oscillators of assessed quality-Generic specification- Historical Version
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BS EN 60679-1:1998
Quartz crystal controlled oscillators of assessed quality-Generic specification- Historical Version
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BS EN 169000:1993
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators- Historical Version
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BS 9620:1975
Specification for quartz crystal oscillators of assessed quality: generic data and methods of test- Historical Version