31.080.10: Diodes
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BS 04/30118741 DC
This document has been replaced. View the most recent version.
IEC 60747-4 ED.2. Semiconductor devices. Discrete devices. Part 4. Microwave diodes and transistors
standard by BSI Group, 08/19/2004.
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Historical Editions: BS IEC 60747-4:2007+A1:2017, BS IEC 60747-4:2007, BS 6493-1.4:1992, BS 3363:SUPPLEMENT NO. 2:1981, BS 3363:SUPPLEMENT NO. 1:1981
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BS 07/30164554 DC
BS EN 62341-5. Organic light emitting diode displays. Part 5. Environmental test methods
standard by BSI Group, 04/05/2007.
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BS 07/30171395 DC
BS EN 62374-1. Semiconductor devices. Part 1. Time dependent dielectric breakdown test (TDDB)for inter-metal layers
standard by BSI Group, 11/19/2007.
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BS 08/30177255 DC
BS EN 62415. Constant current electromigration test
standard by BSI Group, 01/30/2008.
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BS 08/30180164 DC
BS EN 62418. Metallization stress void test
standard by BSI Group, 03/18/2008.
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BS 08/30195574 DC
BS EN 62615. Electrostatic Discharge Sensitivity Testing. Transmission Line Pulse (TLP). Component Level
standard by BSI Group, 12/22/2008.
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BS 10/30203863 DC
BS EN 62629. Optical measurement methods for 3D displays
standard by BSI Group, 02/23/2010.
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- MULTI-USER
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BS 10/30231573 DC
BS EN 60747-3. Semiconductor devices. Part 3. Signal (including switching diodes) and regulator diodes
standard by BSI Group, 07/13/2010.
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- MULTI-USER
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BS EN 120008:1995
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system
standard by British-Adopted European Standard, 03/15/1995.
Languages: English
- MULTI-USER
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BS 13/30281739 DC
This document has been replaced. View the most recent version.
BS EN 62838. Self-ballasted LED-lamps for general lighting services with supply voltages not exceeding 50 V a.c. r.m.s. or 120 V ripple free d.c. Safety specification
standard by BSI Group, 03/20/2013.
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Historical Editions: BS EN 62838:2016
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