1219616 Preview

IEC 62276 Ed. 1.0 en:2005 [ Withdrawn ]

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

standard by International Electrotechnical Commission , 05/30/2005

This document has been replaced. View the most recent version.

View all product details

Historical

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $197.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.
 

Product Details

Edition:
1.0
Published:
05/30/2005
Number of Pages:
34
File Size:
1 file , 740 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. IEC 62276 Ed. 3.0 b:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Most Recent

  2. IEC 62276 Ed. 3.0 en:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version

  3. IEC 62276 Ed. 2.0 b:2012


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version

  4. IEC 62276 Ed. 1.0 en:2005

    👀 currently
    viewing


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version