1844700

IEC 62276 Ed. 2.0 b:2012 [ Withdrawn ]

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

standard by International Electrotechnical Commission , 10/19/2012

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Full Description

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.
 

Product Details

Edition:
2.0
Published:
10/19/2012
Number of Pages:
82
File Size:
1 file , 1 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. IEC 62276 Ed. 3.0 b:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

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  2. IEC 62276 Ed. 3.0 en:2016


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version

  3. IEC 62276 Ed. 2.0 b:2012

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    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version

  4. IEC 62276 Ed. 1.0 en:2005


    Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

    • Historical Version